{"id":2890,"date":"2018-05-29T05:52:35","date_gmt":"2018-05-29T05:52:35","guid":{"rendered":"https:\/\/ampri.res.in\/hi\/?page_id=2890"},"modified":"2018-05-29T07:37:16","modified_gmt":"2018-05-29T07:37:16","slug":"specialized-characterization","status":"publish","type":"page","link":"https:\/\/ampri.res.in\/hi\/?page_id=2890","title":{"rendered":"Specialized Characterization"},"content":{"rendered":"
[vc_row][vc_column][vc_column_text]\n

Specialized Characterization<\/strong><\/span><\/p>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
CANNING ELECTRON MICROSCOPE WITH EDS FACILITY<\/td>\n<\/tr>\n
Application<\/td>\nMicrostructural & fracture studies, elemental\u00a0 analysis of powder and\u00a0 solid materials<\/td>\n <\/p>\n

\u00a0 \u00a0\"\"<\/p>\n<\/td>\n<\/tr>\n

Make<\/td>\nJEOL, Japan and M\/s OXFORD, UK<\/td>\n<\/tr>\n
Model<\/td>\nJSM5600\/LINK ISIS300<\/td>\n<\/tr>\n
Resolution<\/td>\n3.5 nm\/138\u00a0eV<\/td>\n<\/tr>\n
Magnification Limit<\/td>\n1 Lakh times<\/td>\n<\/tr>\n
X-RAY DIFFRACTOMETER and GONIOMETER<\/td>\n<\/tr>\n
Model<\/td>\nD8 Advanced<\/td>\n\"\"<\/td>\n<\/tr>\n
Make<\/td>\nBruker, Germany<\/td>\n<\/tr>\n
Maximum Voltage<\/td>\n40 KV<\/td>\n<\/tr>\n
Maximum Current<\/td>\n40 mA<\/td>\n<\/tr>\n
Step Size Range<\/td>\n0.001-1\u00b0\/sec (2\u04e8)<\/td>\n<\/tr>\n
Angle of Diffraction<\/td>\n3-135\u00b0 (2\u04e8)<\/td>\n<\/tr>\n
Tests<\/td>\nPowder diffraction, Texture, Residual stress<\/td>\n<\/tr>\n
Materials for analysis<\/td>\nThin film, Powder & Bulk materials<\/td>\n<\/tr>\n
FE-SEM with EDX and EBSD<\/td>\n<\/tr>\n
Application<\/td>\nMicro structural examination and phase analysis up to\u00a0nano level<\/td>\n\"\"<\/td>\n<\/tr>\n
Capacity<\/td>\nMagnification 8.00\u00a0lakhs, Resolution 1 nm<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n[\/vc_column_text][\/vc_column][\/vc_row]\n<\/div>","protected":false},"excerpt":{"rendered":"

[vc_row][vc_column][vc_column_text] Specialized Characterization CANNING ELECTRON MICROSCOPE WITH EDS FACILITY Application Microstructural & fracture studies, elemental\u00a0 analysis of powder and\u00a0 solid materials   \u00a0 \u00a0 Make JEOL, Japan and M\/s OXFORD, UK Model JSM5600\/LINK ISIS300 Resolution 3.5 nm\/138\u00a0eV Magnification Limit 1 Lakh times X-RAY DIFFRACTOMETER and GONIOMETER Model D8 Advanced Make Bruker, Germany Maximum Voltage 40 KV Maximum Current 40 mA Step Size Range 0.001-1\u00b0\/sec (2\u04e8) Angle of Diffraction 3-135\u00b0 (2\u04e8) Tests Powder diffraction, Texture, Residual stress Materials for analysis Thin film, Powder & Bulk materials FE-SEM with EDX and EBSD Application Micro structural examination and phase analysis up to\u00a0nano level Capacity Magnification 8.00\u00a0lakhs, Resolution 1 nm [\/vc_column_text][\/vc_column][\/vc_row]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-2890","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=\/wp\/v2\/pages\/2890","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=2890"}],"version-history":[{"count":0,"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=\/wp\/v2\/pages\/2890\/revisions"}],"wp:attachment":[{"href":"https:\/\/ampri.res.in\/hi\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=2890"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}